Profile of Tobias Pfeiffer

Fields of Activity/Competences

  • Interferometry-based vibration correction
  • Terahertz layer-thickness measurements
  • GPU-based evaluation of layer thicknesses

 

Publications

Major Publications

  • Pfeiffer, T.; Weber, S.; Klier, J.; Bachtler, S.; Molter, D.; Jonuscheit, J.; von Freymann, G.:
    Terahertz thickness determination with interferometric vibration correction for industrial applications, Optics Express 26 10, 12558-12568 (2018).

 

Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Optical Society of America -OSA-, Washington/D.C.:
Conference on Lasers and Electro-Optics and the Quantum Electronics and Laser Science Conference, CLEO/QELS 2010. CD-ROM : Laser Science to Photonic Applications, May 16-21, 2010, San Jose, California
Washington, DC: OSA, 2010