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VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Industrial Math
 ematics ITWM//ENGLISH
BEGIN:VEVENT
UID:cf2c8c10-df47-429d-ac60-e4a61ad383a4
DTSTAMP:20260507T220628Z
SUMMARY:Synthetic Data for Defect Segmentation on Complex Metal Surfaces
DTSTART:20231213T100000Z
DTEND:20231213T110000Z
END:VEVENT
END:VCALENDAR
