Paris, France  /  03/12/2019  -  03/14/2019

JEC World

Website JEC World 2019

Joint booth Fraunhofer, hall 6, booth H78

JEC World in Paris is the only trade fair that unites the global composites industry. A sign of the industry's engagement on an international platform where users can find a wide range of processes, new materials and composite solutions. From 12 to 14 March 2019, the trade fair will bring together a wide range of players - from materials production to user industries.
 

Program

With numerous conferences, technical and scientific forums and seminars, the trade fair offers a comprehensive overview of the entire composite materials and value chain. Over 1300 exhibitors from 115 countries will present the latest results from research and development as well as the latest product innovations at JEC World. In particular, the fields of application automotive engineering, aerospace, construction, shipping and transport as well as wind energy will be addressed. Materials 4.0, such as the simulation-driven design of composite materials, will also be the focus of the trade fair.  

Radome Inspection with Millimeter Wave Technology and Hand-held Terahertz Sensor

Our experts from the department »Materials Characterization and Testing« will be on site with an exhibit on the subject of »Radome inspection with millimeter wave technology«. With this sensor it is possible to perform contact-free and non-destructive inspections of lightweight components from the aircraft industry or other industrial sectors. As an example, we will show a radome in the stand display case. A radome is a structural, weatherproof enclosure that protects a radar antenna. Radomes protect the antenna from weather and conceal antenna electronic equipment from view. They also protect nearby personnel from being accidentally struck by quickly rotating antennas.

And we will present our new hand-held terahertz sensor: the solution for difficult problems based on mobile terahertz technology. We will demonstrate its operation live on the basis of suitable samples.