Profil Jens Klier

Schwerpunkte/Kompetenzen

 

  • Konzeption gepulster Terahertz-Systeme für den industriellen Einsatz
  • Schichtdickenmessung mittels gepulster Terahertz-Systeme
  • Ladungsträgerdynamik von III-V - Verbindungshalbleitern

 

Publikationen

Highlightpublikationen

  • Klier, J.; Weber, S.; Molter, D.; Freymann, G.; Jonuscheit, J.:
    Zerstörungsfreie Schichtdickenmessung an Nassfilmen.
    J Oberfl Techn (JOT Journal für Oberflächentechnik) 59, 9 113-115 (2019).
  • Klier, J.; Kharik, D.; Zwetow, W.; Gundacker, D.; Weber, S.; Molter, D.; Ellrich, F.; Jonuscheit, J.; Freymann, G.:
    Four-channel terahertz time-domain spectroscopy system for industrial pipe inspection.
    IRMMW-THz 2018 2018, 1-2 (2018).
  • Pfeiffer, T.; Weber, S.; Klier, J.; Bachtler, S.; Molter, D.; Jonuscheit, J.; von Freymann, G.:
    Terahertz thickness determination with interferometric vibration correction for industrial applications.
    Optics Express 26 10, 12558-12568 (2018).

 

Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Sadwick, L.P. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX : 15-18 February 2016, San Francisco, California, United States
Bellingham, WA: SPIE, 2016 (Proceedings of SPIE 9747)
ISBN: 978-1-62841-982-5
Art. 974712