Profil Joachim Jonuscheit

Schwerpunkte/Kompetenzen

  • Optische Messtechnik
  • Konzeption von Inspektionssystemen für die Qualitätskontrolle in der Produktion
  • Projektakquise und Marketing

 

Publikationen

Highlightpublikationen

  • Baccouche, B.; Agostini, P.; Mohammadzadeh, S.; Kahl, M.; Weisenstein, C.; Jonuscheit, J.; Keil, A.; Löffler, T.; Sauer-Greff, W.; Urbansky, R.; Haring Bolívar, P.; Friederich, F.:
    Three-Dimensional Terahertz Imaging with Sparse Multistatic Line Arrays.
    IEEE Journal of Selected Topics in Quantum Electronics, Vol. 23, No. 4, July/August 2017.
  • Krimi, S.; Klier, J.; Jonuscheit, J.; von Freymann, G.; Urbansky, R.; Beigang, R.:
    Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology.
    Appl. Phys. Lett. 109, 021105, (2016).
  • Ospald, F.; Zouaghi, W.; Beigang, R.; Matheis, C.; Jonuscheit, J.; Recur, B.; Guillet, J.-P.; Mounaix, P.; Vleugels, W.; Bosom, P.; Gonzalez, L.; Lopez, I.; Martinez, R.; Sternberg, Y.; Vandewal, M:
    Aeronatuics composite material inspection with a terahertz time-domain spectroscopy system.
    Optical engineering 53 (3), 031208, (2013).
  • Molter, D.; Wagner, A.; Weber, S.; Jonuscheit, J.; Beigang, R.:
    Combless broadband terahertz generation with conventional laser diodes.
    Opt. Express, Vol. 19, p. 5290-5296, (2011).

 

Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark
Institute of Electrical and Electronics Engineers -IEEE-:
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016 : 25-30 September 2016, Copenhagen, Denmark