Fraunhofer ITWM Develops Optical Measurement Systems for the Sub-2 µM Range

The Next Generation of OCT Layer Thickness Measurement Systems

Press Release /

Imaging techniques are known mainly from medicine: high-resolution optical coherence tomography (OCT) is used in ophthalmology, for example. The Fraunhofer Institute for Industrial Mathematics ITWM uses this technique to measure the thickness of very thin layers and is developing the next generation of these measurement systems in the »Dünnschicht-OCT« project. In this project, the researchers, together with Mabri.Vision GmbH, are advancing into layer thickness ranges of less than 2 µm. The German Federal Ministry for Economic Affairs and Climate Action is funding the project in its »Zentrales Innovationsprogramm Mittelstand« (ZIM).