Non-destructive measuring with terahertz and microwaves
We develop measurement systems for practical application in the characterization and testing of materials. To do so, the scientists draw on their expertise in optical systems and measurement technology, spectroscopy, and the development of crystal and semiconductor components. The techniques cover a range from optical coherence tomography (OCT) in the visible spectrum to time-domain spectroscopy in the terahertz frequency range as well as electronic system concepts in the millimeter wavelength range. In materials testing, defects can be identified in ceramics, plastics or fiber-reinforced composites on a non-destructive basis.