Non-Destructive Measuring with Terahertz and Microwaves
We develop measurement systems for practical application in the characterization and testing of materials. To do so, the scientists draw on their expertise in optical systems and measurement technology, spectroscopy, and the development of crystal and semiconductor components. The techniques cover a range from optical coherence tomography (OCT) in the visible spectrum to time-domain spectroscopy in the terahertz frequency range as well as electronic system concepts in the millimeter wavelength range. In materials testing, defects can be identified in ceramics, plastics or fiber-reinforced composites on a non-destructive basis.
Our researchers particularly focus on layer thickness measurement, for example in coating processes. Besides OCT, measurement techniques in the terahertz or millimeter wavelength range present alternatives to ultrasound measurements when mechanical contact is not possible or desirable. These techniques can also be used to replace X-ray measurements in situations where ionizing radiation would raise problems. In addition to determining thickness, the measurement systems are able to investigate the material parameters of individual layers and use chemometric analysis methods to identify these characteristics clearly and reliably.
We offer the following services relating to all aspects of materials charcterization and testing
- Technology consulting
- Initial tests and feasibility studies
- Measuring studies and measurements on customers site
- Development from single components up to individual complete systems
- Equipment rent